The article consider the influence of illumination and distance on the recognition quality for various models of neural networks of embedded systems. The platforms on which the testing was carried out, as well as the models used, are described. The results of the study of the influence of illumination on the quality of recognition are presented.
Keywords: artificial intelligence, computer vision, embedded systems, pattern recognition, YOLO, Inception, Peoplenet, ESP 32, Sipeed, Jetson, Nvidia, Max